Abstract
Simulation of phasic development in wheat is necessary in
constructing wheat growth and yield
models. It is also useful for evaluating cultivar adaptation and
scheduling cultural practices. This
paper describes a conceptual model of wheat development based on
phenological principles, as
affected by vernalization, photoperiod, thermal response and intrinsic
earliness, and also reports the
results of sensitivity analysis and validation of the model.The model predicts when the plant will reach double ridge, terminal
spikelet and heading. In the
model, the daily thermal sensitivity of development following emergence
is determined by an
interaction of ‘relative vernalization completion’ and
‘relative photoperiod effectiveness’ for that
day. After complete vernalization is reached, the daily thermal
sensitivity is determined only by
relative photoperiod effectiveness, which gradually increases from
terminal spikelet to heading. A
multiplication between the daily thermal sensitivity and thermal
effectiveness generated daily
flowering time, which was accumulated to trigger a particular
developmental stage. Genotypic
differences were characterized as vernalization requirement, photoperiod
sensitivity and intrinsic earliness.The model showed a sensitive response to environmental variables
of temperature and daylength,
and to genetic parameters of vernalization requirement and photoperiod
sensitivity. Evaluation of the
model using multiple experimental data involving various cultivars and
planting dates exhibited a
marked goodness of fit between simulation and observation with a root
mean square error <5 days.
The results indicate that the model can be used as a predictor for the
major flowering stages, as well
as functioning as a knowledge base for understanding the characteristics
of different development components in wheat.
Publisher
Cambridge University Press (CUP)
Subject
Genetics,Agronomy and Crop Science,Animal Science and Zoology
Cited by
70 articles.
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