Deconvolution of Powder Diffraction Spectra

Author:

Wiedemann K. E.,Unnam J.,Clark R. K.

Abstract

AbstractAn improved deconvolution theory is presented for the resolution enhancement in powder diffraction spectra. In powder patterns, diffracted intensity, which is conceptually located at a single 2θ position, is actually distributed over a range of 2θ because of instrumental factors, crystal defects, beam penetration, and sample flatness. The location of the peak is usually taken as the peak maximum or the peak centroid. However, when interpreting complex spectra these approaches to locating peaks are not straightforward and deconvolution can be a useful tool. The method presented herein enhances resolution without altering peak area or peak position. Comparisons are made with results of other methods, with emphasis on deconvoluting spectra that contain random error. The discussion includes treatment of discrete data and analysis of the properties of the solution.

Publisher

Cambridge University Press (CUP)

Subject

Condensed Matter Physics,Instrumentation,General Materials Science,Radiation

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Analysis of local composition gradients in the hard-phase grains of cermets using a combination of X-ray diffraction and electron microscopy;International Journal of Refractory Metals and Hard Materials;2008-05

2. Chalcopyrite leaching by Thiobacillus ferrooxidans: effect of shock activation on chalcopyrite surface characteristics and copper solubilization;Biohydrometallurgy and the Environment Toward the Mining of the 21st Century - Proceedings of the International Biohydrometallurgy Symposium;1999

3. Rapid Thermal Annealing of Tungsten Silicide Films;MRS Proceedings;1995

4. New x-ray diffraction method of additions for crystalline silica;Analytica Chimica Acta;1994-02

5. Calibrating for X-Ray Diffraction Analysis of Trace Quartz;Advances in X-ray Analysis;1991

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