Site-specific Lift Out Sample Preparation Technique for Atom Probe Analysis-Reference-Cited by-同舟云学术

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Site-specific Lift Out Sample Preparation Technique for Atom Probe Analysis

Published:2006-07-31 Issue:S02 Volume:12 Page:1742-1743
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:Microsc Microanal

Author:

Lawrence D,Thompson K,Larson DJ,Gorman B

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Publisher

Cambridge University Press (CUP)

Subject

Instrumentation

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Atomic-level quantum well degradation of GaN-based laser diodes investigated by atom probe tomography;Journal of Applied Physics;2024-07-22

2. Application of atom probe tomography to fundamental issues of steel materials;Surface and Interface Analysis;2018-09-03

3. Atom probe tomography of stress corrosion crack tips in SUS316 stainless steels;Corrosion Science;2015-09

4. Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards;Microscopy and Microanalysis;2015-08

5. Atom Probe Tomography Analysis of Bulk Chemistry in Mineral Standards;Microscopy and Microanalysis;2015-08

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