High Speed and Sensitive X-ray Analysis System with Automated Aberration Correction Scanning Transmission Electron Microscope-Reference-Cited by-同舟云学术

High Speed and Sensitive X-ray Analysis System with Automated Aberration Correction Scanning Transmission Electron Microscope

Published:2015-03-30 Issue:1 Volume:45 Page:1-8
ISSN:2287-5123
Container-title:Applied Microscopy
language:en
Short-container-title:AM

Author:

Inada Hiromi¹,Hirayama Yoichi¹,Tamura Keiji¹,Terauchi Daisuke¹,Namekawa Ryoji¹,Shichiji Takeharu¹,Sato Takahiro¹,Suzuki Yuya¹,Ohtsu Yoshihiro¹,Watanabe Keitaro¹,Konno Mitsuru¹,Tanaka Hiroyuki¹,Saito Koichiro¹,Shimoyama Wataru¹,Nakamura Kuniyasu¹,Kaji Kazutoshi¹,Hashimoto Takahito¹

Affiliation:

1. Division of Science & Medical Systems Design, Science & Medical Systems Business Group, Hitachi High-Technologies Corporation, Hitachinaka 312-0033, Japan

Publisher

Korean Society of Electron Microscopy

Link

http://ocean.kisti.re.kr/downfile/crosscheck/ksem/JAKO201510763641456.pdf

Reference19 articles.

1. Beck, VD (1979). A hexapole spherical aberration corrector. Optik. 53, 241-255.

2. Crewe, AV (1982). A system for the correction of axial aperture aberrations in electron lenses. Optik. 60, 271-281.

3. A Critique of the Continuum Normalization Method used for Biological X-Ray Microanalysis

4. Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope

5. Development of Two Steradian EDX System for the HD-2700 FE-STEM Equipped with Dual X-MaxN 100 TLE Large Area Windowless SDDs

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