Optimization of Cu2O Thickness to Enhance Photocatalytic Properties of Electrodeposited Cu2O/FTO Photoanode

Author:

Khasanah Riza Ariyani Nur123ORCID,Chien Forest Shih-Sen2ORCID,Prasetyowati Rita1ORCID,Yudianti Rike3ORCID

Affiliation:

1. Department of Physics Education, Universitas Negeri Yogyakarta, Yogyakarta 55281, Indonesia

2. Department of Applied Physics, Tunghai University, Taichung 407224, Taiwan

3. Research Center for Advanced Materials, National Research, and Innovation Agency (BRIN), Tangerang Selatan 15314, Indonesia

Abstract

Currently, n-type cuprous oxide (Cu2O) is a promising material as photocatalyst because of its energy gap of 2 eV that absorbs visible light up to a wavelength of 600 nm. As a photoelectrode, the thickness of Cu2O is crucial, where the improper thickness may worsen the photocatalytic properties. This work aimed to enhance the photocatalytic properties of Cu2O electrodeposited on fluorine-doped tin oxide (FTO), called Cu2O/FTO, by optimizing the Cu2O thickness. The thickness of Cu2O was controlled by adjusting the deposition time in the electrochemical deposition of Cu2O/FTO. By changing the deposition time from 5 to 45 min, the morphology of Cu2O changed from a leaf-like shape to an irregular facet shape with highly dense coverage, and the average thickness increased from 370 to 1100 nm. The increasing Cu2O thickness resulted in the increasing light absorption. The Cu2O/FTO demonstrated anodic photocurrent, which increased with the Cu2O thickness up to a threshold value of 1000 nm (35 min deposition time). At a thickness of 1000 nm, Cu2O/FTO achieved the highest photocurrent (150 and 58 µA under irradiation of 365 and 470 nm, respectively) due to the highly dense morphology and high absorption. In addition, with a thickness of 1000 nm, the charge diffusion was still good. Further, the increase of Cu2O film thickness higher than 1000 nm caused low photocatalytic properties even though the morphology was highly dense, and the absorption was the highest. This condition could be due to the relatively too-high resistance of Cu2O that caused poor charge diffusion. Copyright © 2024 by Authors, Published by BCREC Publishing Group. This is an open access article under the CC BY-SA License (https://creativecommons.org/licenses/by-sa/4.0).

Funder

Ministry of Science and Technology (MOST) Taiwan

Publisher

Bulletin of Chemical Reaction Engineering and Catalysis

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3