Refractive Index, Temperature and Pressure of Elliptical Plasmonic Waveguide Resonator

Abstract

This paper proposes the elliptical-shaped based on two-dimensional Metal-Insulator-Metal (MIM) plasmonic waveguide configuration with the sensor characteristics simulated by Finite-Element-Method (FEM). Temperature, refractive index, and pressure are evaluated in the structure by considering the transmission spectrum. As the temperature and refractive index increase, the corresponding curves shift to the right wavelengths. Simulation results show that resonant wavelength of nanocavity shifts to lower wavelength with increasing the pressure. It can be seen that the resonance curves between 1300nm to 1400nm are sharper than the other wavelengths in this structure. The sensitivity and the Figure of Merit (FOM) can be evaluated by considering the mentioned equations. The proposed structure could be applied to develop resonator applications with high sensitivity and tunable response.