Can optical fiber compete with profile analysis tensiometry in critical micelle concentration measurement?

Author:

Hajirasouliha Farzaneh1ORCID,Yang Hua23,Wu Qiang23ORCID,Zabiegaj Dominika1ORCID

Affiliation:

1. Smart Materials and Surfaces Laboratory, Department of Mechanical and Construction Engineering, Faculty of Engineering and Environment , Northumbria University , Newcastle upon Tyne , NE1 8ST , UK

2. Key Laboratory of Nondestructive Testing , Ministry of education, Nanchang Hangkong University , Nanchang , 330063 , China

3. Department of Mathematics, Physics and Electrical Engineering, Faculty of Engineering and Environment , Northumbria University , Newcastle upon Tyne , NE1 8ST , UK

Abstract

Abstract Critical micelle concentration (CMC) is one of the important nominal characteristics of the surfactants which can be measured using various methods. In this study, to detect the CMC of two ionic surfactants, cetyltrimethylammonium bromide (CTAB) and sodium dodecyl sulfate (SDS), two methods were utilized: (a) optical fiber and (b) drop profile analysis tensiometry (PAT) techniques. The spectrum width center and surface tension of the solutions at different concentrations of the surfactant were measured. The preliminary outcomes showed a compliance between optical fiber method and PAT technique. However, there were differences in the behavior of two surfactants in optical fiber measurement. In this method, when the solid surface of fiber is put in the system, the interactions between surfactant molecules and the fiber surface must be carefully considered.

Publisher

Walter de Gruyter GmbH

Subject

Physical and Theoretical Chemistry

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