Retention Model of Single-Electron Memory (SEM) Using Disintegration Theory-Reference-Cited by-同舟云学术

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Retention Model of Single-Electron Memory (SEM) Using Disintegration Theory

Published:2005-01 Issue:4 Volume:6 Page:
ISSN:2191-0294
Container-title:International Journal of Nonlinear Sciences and Numerical Simulation
language:
Short-container-title:

Author:

Guo Rong-Hui,Zhao Zheng-Ping,Lu Miao,Liu Yu-Gui,Wu Yi-Bin

Publisher

Walter de Gruyter GmbH

Subject

Applied Mathematics,General Physics and Astronomy,Mechanics of Materials,Engineering (miscellaneous),Modeling and Simulation,Computational Mechanics,Statistical and Nonlinear Physics

Link

https://www.degruyter.com/document/doi/10.1515/IJNSNS.2005.6.4.431/pdf

Reference9 articles.

1. Micro-fracture Toughness in A Nanoceramic Composite

2. Theoretical Study on Effect of the Size of Silver Nanoparticles on the Localized Surface Plasmon Resonance Spectrum of Silver Nanoparticles Embedded in BaO Thin Film

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