Affiliation:
1. Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg Germany
Abstract
Abstract
Surface sensitive X-ray scattering methods are mostly non-destructive
tools which are frequently used to investigate the nature of thin
films, interfaces and artificial near surface structures. Discussed
here are diffraction based methods, namely reflectometry and the
related techniques grazing incidence diffraction and crystal
truncation rod measurements. For the experiment, an X-ray beam is
diffracted from surface near structures of the sample and detected by
adequate detectors. To analyze the data the according X-ray scattering
theory has to be applied. The full theory of surface sensitive X-ray
scattering is complex and based on general considerations from wave
optics. However, instructive insights into the scattering processes
are provided by the Born-approximation which in many cases yields
sufficient results. The methods are applied to solve the structure of
a mercury-electrolyte interface during a chemical reaction and to
determine the strain distribution in surface near SiGe quantum dots.
Subject
Physical and Theoretical Chemistry
Cited by
1 articles.
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