XXXI New contributions to interferometry. Part V.—New multiple beam white light interference fringes and their applications-Reference-Cited by-同舟云学术

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XXXI New contributions to interferometry. Part V.—New multiple beam white light interference fringes and their applications

Published:1945-04 Issue:255 Volume:36 Page:225-236
ISSN:1941-5982
Container-title:The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science
language:en
Short-container-title:The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science

Author:

Tolansky S.

Publisher

Informa UK Limited

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786444508521499

Reference6 articles.

1. An Interferometric Procedure for the Examination of Crystal Surfaces

2. LXIV. New contributions to interferometry. Part I.—New non-localized interference fringes

3. XIV. New contributions to interferometry. Part II—New interference phenomena with Newton's rings

4. XIX. New contributions to interferometry. Part III.—The differential polarization phase change on reflection at a thin silver film

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dual-image multiple-beam fringes of equal chromatic order for dynamic characterization of fibers;Journal of the Optical Society of America B;2020-01-23

2. References;Optical Interferometry;2003

3. Microparticle adhesion studies by atomic force microscopy;Journal of Adhesion Science and Technology;2002-01

4. Silicon (Si);Handbook of Optical Constants of Solids;1997

5. Silicon (Si);Handbook of Optical Constants of Solids;1985

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