Nanoindentation and picoindentation measurements using a capacitive transducer system in atomic force microscopy
Author:
Publisher
Informa UK Limited
Subject
Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/01418619608239712
Reference18 articles.
1. INSPEC, EMIS Data Reviews, Series No. 2,1990
2. Proceedings of the Ninth IEEE Annual International Workshop on Micro Electro Mechanical Systems. pp.91–98. New York: IEEE.
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