Return-path Ellipsometry and a Novel Normal-incidence Null Ellipsometer (NINE)-Reference-Cited by-同舟云学术

Return-path Ellipsometry and a Novel Normal-incidence Null Ellipsometer (NINE)

Published:1977-10 Issue:10 Volume:24 Page:1039-1049
ISSN:0030-3909
Container-title:Optica Acta: International Journal of Optics
language:en
Short-container-title:Optica Acta: International Journal of Optics

Author:

Azzam R.M.A.¹

Affiliation:

1. a Hematology Division and Department of Internal Medicine, University of Nebraska Medical Center, Omaha, Nebraska 68105, and Electrical Materials Laboratory, College of Engineering, University of Nebraska, Lincoln, Nebraska 68588, U.S.A.

Publisher

Informa UK Limited

Subject

Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/713819411

Reference8 articles.

1. The Optical Constants of Several Metals in Vacuum*

2. A new type of precision ellipsometer without employing a compensator

3. Autocollimation-type ellipsometer for monitoring film growth through a single window

4. Optical antsotropy in the plane parallel to the surface of obliquely evaporated gold films

5. PIE: Perpendicular-incidence ellipsometry—application to the determination of the optical properties of uniaxial and biaxial absorbing crystals

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