Dielectric Spectroscopy Measurements of Relaxor Ferroelectric PLZT 9/65/35 Thin Films Obtained by RF Assisted PLD
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/00150190490456286
Reference6 articles.
1. Effects of lanthanum modification on rhombohedral Pb(Zr1−xTix)O3 ceramics: Part I. Transformation from normal to relaxor ferroelectric behaviors
2. The growth behavior of Pb0.95La0.05(Zr0.7Ti0.3)0.9875O3films on silicon substrates synthesized by pulsed laser deposition
3. Phase transformation and paired-plate precipitate formation in Pb0.91La0.09Zr0.65Ti0.35O3 films grown on sapphire substrates
4. Dielectric anomalies in epitaxial films of relaxor ferroelectric(PbMg1/3Nb2/3O3)0.68−(PbTiO3)0.32
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