1. Evaluation of control charts under linear trend
2. ANDERSON, D. N. Innovation, quality, time-the patternership for customer satisfaction. Proceedings of the Second International FAIM Conference. pp.3–11.
3. A framework for robust run by run control with lot delayed measurements
4. BONING, D., MOYNE, W., SMITH, T., MOYNE, J. and HURWITZ, A. Practical issues in run by run process control. IEEE/ SEMI Advanced Semiconductor Manufacturing Conference.