Spectroscopic ellipsometry investigation and morphological characterization of electrodeposited Cu2O thin films: annealing effect-Reference-Cited by-同舟云学术

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Spectroscopic ellipsometry investigation and morphological characterization of electrodeposited Cu2O thin films: annealing effect

Published:2020-12-01 Issue:12 Volume:93 Page:1171-1182
ISSN:0141-1594
Container-title:Phase Transitions
language:en
Short-container-title:Phase Transitions

Author:

Messaoudi Olfa¹²^ORCID,Mansouri Moufida³,Manai Leila¹,Elgharbi Sarra⁴,Azhary Arwa¹,Bardaoui Afrah²

Affiliation:

1. Physics Department, College of Sciences, University of Ha’il, Saudi Arabia

2. Laboratory of Nanomaterials and Systems for Renewable Energy, Research and Technology Center of Energy, Hammam Lif, Tunisia

3. Center for Functionalized Magnetic Materials, Immanuel Kant Baltic Federal University, Kaliningrad, Russia

4. Chemistry Department, College of Sciences, University of Ha’il, Saudi Arabia

Funder

Research Deanship of the University of Ha’il-Saudi Arabia

Publisher

Informa UK Limited

Subject

General Materials Science,Instrumentation

Link

https://www.tandfonline.com/doi/pdf/10.1080/01411594.2020.1850727

Reference38 articles.

1. Controlled growth and characteristics of single-phase Cu2O and CuO films by pulsed laser deposition

2. Optical and structural properties of copper oxide thin films grown by oxidation of metal layers

3. The preparation of copper(II) oxide thin films and the study of their microstructures and optical properties

4. Binary copper oxide semiconductors: From materials towards devices

5. 820 mV open-circuit voltages from Cu2O/CH3CN junctions

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1. Physical and electrochemical properties of spray-deposited Co3O4 thin films;Phase Transitions;2021-08-17

2. Structural, optical and electrical properties of spray-deposited Fe-doped nanocrystalline ZnS0.2Se0.8 thin films;Phase Transitions;2021-06-04

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