1. Dislocation climb sources activated by 1 MeV electron irradiation of copper-nickel alloys
2. The measurement of stacking-fault energies of pure face-centred cubic metals
3. Head, A. K., Humble, P., Clarebrough, L. M., Morton, A. J. and Forwood, C. T. 1973.Computed Electron Micrographs and Defect Identification, 83Amsterdam, London: North-Holland.
4. Hirsch, P. B., Howie, A., Nicholson, R. B., Pashley, D. W. and Whelan, M. J. 1965.Electron Microscopy of Thin Crystals, 178261London: Butterworths.
5. On Dislocation Interactions in the fcc Lattice