Measurement of the relative strain ratios normal to the crystal planes in Cu thin films using grazing incidence X-ray diffraction
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Published:2016-04-02
Issue:4
Volume:96
Page:142-147
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ISSN:0950-0839
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Container-title:Philosophical Magazine Letters
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language:en
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Short-container-title:Philosophical Magazine Letters
Author:
Himuro T.,Takayama S.
Publisher
Informa UK Limited
Subject
Condensed Matter Physics