Critical thickness for dislocation generation in epitaxial piezoelectric thin films
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics
Link
http://www.tandfonline.com/doi/pdf/10.1080/14786430310001600196
Reference16 articles.
1. Two dimensional electron gases induced by spontaneous and piezoelectric polarization in undoped and doped AlGaN/GaN heterostructures
2. Dislocations and line charges in anisotropic piezoelectric insulators
3. One-dimensional dislocations. I. Static theory
4. The Stability of a Dislocation Threading a Strained Layer on a Substrate
5. A critical thickness condition for a strained compliant substrate/epitaxial film system
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A fast approach to measuring the thickness uniformity of a homoepilayer grown on to any type of silicon wafer;Semiconductor Science and Technology;2022-04-20
2. Effect of Misfit Strains on the Skyrmion Crystal Phase in Epitaxial Thin Films of Helimagnets;physica status solidi (RRL) - Rapid Research Letters;2018-08-02
3. Effect of piezoelectricity on critical thickness for misfit dislocation formation at InGaN/GaN interface;Computational Materials Science;2015-02
4. Strain Engineering: Ferroelectric Films on Compliant Substrates;Advanced Topics in Science and Technology in China;2013
5. Surface morphology and composition studies in InGaN/GaN film grown by MOCVD;Journal of Semiconductors;2011-08
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3