Crystallization, resistivity and microstructure of metal–silicon thin-film alloys
Author:
Affiliation:
1. a Dipartimento di Fisica , Università di Modena , Via Campi 213/A, 41100 , Modena , Italy
Publisher
Informa UK Limited
Subject
General Physics and Astronomy,General Chemical Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/13642819008219297
Reference32 articles.
1. Kinetics of Phase Change. I General Theory
2. Electrical resistance and crystallization characteristics of Fe80B20
3. Metastable phase formation in titanium‐silicon thin films
4. The crystallization of amorphous germanium films
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