Optimal Limits for Attributes Control Charts
Author:
Affiliation:
1. Case Western Reserve University, Cleveland, OH 44106-7054
2. California State University, Chico, CA 95929-0525
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management,Safety, Risk, Reliability and Quality
Link
https://www.tandfonline.com/doi/pdf/10.1080/00224065.1997.11979728
Reference25 articles.
1. THE TRANSFORMATION OF POISSON, BINOMIAL AND NEGATIVE-BINOMIAL DATA
2. Transformations Related to the Angular and the Square Root
3. Some Considerations in the Use of Quality Control Techniques in Integrated Circuit Fabrication
4. Shewhart x-charts with estimated process variance
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