Negative differential resistivity in ferroelectric thin-film current-voltage relationships
Author:
Affiliation:
1. a Symetrix Corporation , Colorado Springs, CO, USA
2. b University of Colorado, Depts. of Physics and of Electrical Engineering , Boulder and Colorado Springs, CO, USA
Publisher
Informa UK Limited
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/10584589408018662
Reference9 articles.
1. Quantitative measurement of space‐charge effects in lead zirconate‐titanate memories
2. Volume-Controlled, Two-Carrier Currents in Solids: The Injected Plasma Case
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