Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources-Reference-Cited by-同舟云学术

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Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources

Published:2010-10 Issue:6-10 Volume:165 Page:441-450
ISSN:1042-0150
Container-title:Radiation Effects and Defects in Solids
language:en
Short-container-title:Radiation Effects and Defects in Solids

Author:

Krása J.,Láska L.,Rohlena K.,Velyhan A.,Czarnecka A.,Parys P.,Ryć L.,Wolowski J.

Publisher

Informa UK Limited

Subject

Condensed Matter Physics,General Materials Science,Nuclear and High Energy Physics,Radiation

Link

http://www.tandfonline.com/doi/pdf/10.1080/10420151003718402

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characteristics of target polarization by laser ablation;Laser and Particle Beams;2015-07-09

2. Ion and X-ray techniques used for study of laser-produced plasmas;Radiation Effects and Defects in Solids;2015-04-03

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