Fusion Neutron Irradiation Effects on Electric Characteristics of Semiconductor Electronic Devices-Reference-Cited by-同舟云学术

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Fusion Neutron Irradiation Effects on Electric Characteristics of Semiconductor Electronic Devices

Published:1984-08 Issue:8 Volume:21 Page:634-641
ISSN:0022-3131
Container-title:Journal of Nuclear Science and Technology
language:en
Short-container-title:Journal of Nuclear Science and Technology

Author:

IIDA Toshiyuki,MAEKAWA Tatsuyuki,SUMITA Kenji,LOGAN Clinton M.,HEIKKINEN Dale W.

Publisher

Informa UK Limited

Subject

Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://www.tandfonline.com/doi/pdf/10.1080/18811248.1984.9731092

Reference5 articles.

1. RTNS-II: Present Status

2. Papers presented at the IEEE Annu. Conf. on Nuclear and Space Radiation Effects

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of Semiconductor Preamplifier with Radiation Hardness;RADIOISOTOPES;2021-05-15

2. Correlation of Fusion and Fission Neutron Damage in Transistors;Journal of Nuclear Science and Technology;1989-02

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