Thickness and birefringence of thin films assessed by interferometry using a low-cost spectrometer
Author:
Affiliation:
1. Department of Materials Science and Engineering, National Defense Academy, Yokosuka, Japan
Funder
JSPS KAKENHI
Publisher
Informa UK Limited
Subject
Spectroscopy,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Link
https://www.tandfonline.com/doi/pdf/10.1080/00387010.2021.1991382
Reference40 articles.
1. Determination of Refractive Index and Film Thickness from Interference Fringes
2. Interference colors in thin films
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5. Low-Cost Hyperspectral Imaging System: Design and Testing for Laboratory-Based Environmental Applications
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1. Large-Area Thickness Measurement of Transparent Films Based on a Multichannel Spectral Interference Sensor;Applied Sciences;2024-03-27
2. A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing;Sensors;2023-06-04
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