Monitoring the leaf equivalent water thickness of kiwifruit in high temperature using leaf spectral reflectance-Reference-Cited by-同舟云学术

Monitoring the leaf equivalent water thickness of kiwifruit in high temperature using leaf spectral reflectance

Author:

Zhang Zhen¹²^ORCID,Fu Yu¹²,Li Hualong¹²,Guo Jianping³,Pan Yuying¹²,Zhang Yong¹²,Zhang Weimin¹²,Wang Jinghong²⁴,Liu Yuefeng¹²,Liu Lu¹²

Affiliation:

1. Shaanxi Meteorological Service Center of Agricultural Remote Sensing and Economic Crops, Xi’an, China

2. Key Laboratory of Eco-environment and Meteorology for the Qinling Mountains and Loess Plateau, Shaanxi Meteorological Bureau, Xi’an, China

3. Chinese Academy of Meteorological Sciences, Beijing, China

4. Shaanxi Meteorological Training Center, Shaanxi Meteorological Bureau, Xi’an, China

Funder

Natural Science Basic Research Program of Shaanxi Province

National Key Research and Development Program of China

Qinling and Loess Plateau Eco-Environmental Meteorological Key Laboratory Open Research Fund Project

Publisher

Informa UK Limited

Subject

Spectroscopy,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Link

Reference52 articles.

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