VI. Electron distribution in electron-optically focused electron beams-Reference-Cited by-同舟云学术

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VI. Electron distribution in electron-optically focused electron beams

Published:1939-07 Issue:186 Volume:28 Page:81-98
ISSN:1941-5982
Container-title:The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science
language:en
Short-container-title:The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science

Author:

Jacob L.

Publisher

Informa UK Limited

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786443908521164

Reference4 articles.

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. BIBLIOGRAPHY FOR PART 1;Electron Optics;1972

2. A wide slit scanning method for measuring electron and ion beam profiles;Journal of Physics E: Scientific Instruments;1971-01

3. Measurements of the Limiting Image Current Density produced by Electron Guns of Rotational Symmetry†;Journal of Electronics and Control;1961-05

4. Potential well modulation of electron beams;Physikalisch-Technischer Teil;1960

5. Kathoden;Vierter Internationaler Kongress für Elektronenmikroskopie / Fourth International Conference on Electron Microscopy / Quatrième Congrès International de Microscopie Électronique;1960

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