Wigner–Ville distribution based diffraction phase microscopy for non-destructive testing
Author:
Affiliation:
1. Department of Electrical Engineering, Indian Institute of Technology Kanpur, Kanpur, India
2. Center for Lasers and Photonics, Indian Institute of Technology Kanpur, Kanpur, India
Publisher
Informa UK Limited
Subject
Atomic and Molecular Physics, and Optics
Link
https://www.tandfonline.com/doi/pdf/10.1080/09500340.2019.1655597
Reference31 articles.
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2. Speckle Interferometry: A Review of the Principal Methods in Use for Experimental Mechanics Applications
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4. Digital recording and numerical reconstruction of holograms
5. Detection of defects from fringe patterns using a pseudo-Wigner–Ville distribution based method
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