Relations between the orientations of ion bombarded single crystals, resulting surface structures and sputtered spot patterns-Reference-Cited by-同舟云学术

Relations between the orientations of ion bombarded single crystals, resulting surface structures and sputtered spot patterns

Published:1981-01 Issue:3-4 Volume:56 Page:241-249
ISSN:0033-7579
Container-title:Radiation Effects
language:en
Short-container-title:Radiation Effects

Author:

Alexander V.,Lippold H.-J.,Niedrig H.

Publisher

Informa UK Limited

Subject

General Engineering

Link

http://www.tandfonline.com/doi/pdf/10.1080/00337578108229896

Reference13 articles.

1. Influence of Faceting on Ejection Patterns Obtained from Ion‐Bombarded Face‐Centered Cubic Metals

2. The surface microtopography induced by ion bombardment on Cu single crystals

3. Brunner, M. and Erlenwein, P. Proc. Ninth Intern. Congress On Electron Microscopy. Vol. 1, pp.562Toronto: Microscopical Society of Canada.

4. Alexander, V., Lippold, H.J. and Niedrig, H. Proc. Symp. on Sputtering Perchtoldsdorf/Vienna 1980. Edited by: Varga, P., Betz, G. and Vieböck, F. D. April. Austria: Publ. Inst. f. Allg. Phys., TU Wien, Karlsplatz 13, A-1040 Wien.

5. Sputtering Pattern Distortions on Plane and Cylindrical Collectors Deposit Structure of Aluminium Pattern between 100 and 560°K

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface topography of eroded Cu and Si cathodes in a PIG ion source;Bulletin of Materials Science;1993-06

2. Study of ion-bombardment-induced surface topography of silver by stereophotogrammetric method;Radiation Effects and Defects in Solids;1992-04

3. Surface topography of 40Ar+ and 84Kr+ bombarded copper, silver and nickel;Surface and Coatings Technology;1992-04

4. Surface topography of a Cu single crystal by Ar+ ion sputtering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1991-08

5. Topography of Solid Surfaces Modified by Fast Ion Bombardment;Advances in Electronics and Electron Physics;1990