Contrast from stacking faults and partial dislocations in the field-ion microscope
Author:
Affiliation:
1. a Department of Metallurgy , University of Cambridge
2. b Laboratorio de Fisica e Engenharia, Nucleares , Lisbon
3. c Division of Inorganic and Metallic Structures, National Physical Laboratory , Teddington, Middlesex
Publisher
Informa UK Limited
Link
https://www.tandfonline.com/doi/pdf/10.1080/14786436808223183
Reference11 articles.
1. A field-ion microscope study of segregation to grain boundaries in iridium
2. The interpretation of field-ion micrographs: Contrast from perfect dislocation loops
3. LXXXIII. Crystal dislocations.—Elementary concepts and definitions
4. Debris Mechanism of Strain‐Hardening
Cited by 53 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Ab initio vacancy formation energies and kinetics at metal surfaces under high electric field;Physical Review B;2023-01-20
2. A model to predict image formation in the three-dimensional field ion microscope;Computer Physics Communications;2021-03
3. Advanced data mining in field ion microscopy;Materials Characterization;2018-12
4. Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations;Journal of Materials Research;2018-11-06
5. True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy;Microscopy and Microanalysis;2017-03-24
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3