Photochemical degradation of a silicate in the beam of the electron microscope
Author:
Publisher
Informa UK Limited
Link
http://www.tandfonline.com/doi/pdf/10.1080/14786436908228205
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1. Borom, M. P. and Hanneman, R. E. 1966. General Electric Report No. 66-C-484
2. Oxygen Outgassing Caused by Electron Bombardment of Glass
3. Massey, H. S. W. 1952.Advances in Electronics, Vol. IV, 1New York: Academic Press.
4. The kinetics of the ordering process in triclinic NaAlSi3O8
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