Effects of conducting defects on resistive switching characteristics of SiNx-based resistive random-access memory with MIS structure-Reference-Cited by-同舟云学术

Effects of conducting defects on resistive switching characteristics of SiNx-based resistive random-access memory with MIS structure

Published:2015-11 Issue:6 Volume:33 Page:062201
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
language:en
Short-container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Author:

Kim Sungjun¹,Cho Seongjae²,Ryoo Kyung-Chang³,Park Byung-Gook¹

Affiliation:

1. Department of Electrical and Computer Engineering, Inter-University Semiconductor Research Center (ISRC), Seoul National University, Seoul 08826, South Korea

2. Department of Electronic Engineering, Gachon University, Gyeonggi-do 13120, South Korea

3. DRAM Product Planning Team, Memory Division, Semiconductor Business, Samsung Electronics Co., Ltd., Gyeonggi-do 18448, South Korea

Funder

National Research Foundation of Korea (NRF)

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4931946

Cited by 23 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Soret-Effect Induced Phase-Change in a Chromium Nitride Semiconductor Film;ACS Nano;2024-08-01

2. Silicon nitride resistance switching MIS cells doped with silicon atoms;Solid-State Electronics;2024-03

3. Amorphous BN-Based Synaptic Device with High Performance in Neuromorphic Computing;Materials;2023-10-15

4. Soret-effect induced phase-change in chromium nitride semiconductor film;2023-02-01

5. Non-volatile memory characteristics of a Ti/HfO2/Pt synaptic device with a crossbar array structure;Chaos, Solitons & Fractals;2022-09