Optimization of n+μc-Si:H contact layer for low leakage current in a-Si:H thin film transistors
Author:
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
http://avs.scitation.org/doi/pdf/10.1116/1.582248
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4. Current stress metastability in a-Si:H thin film transistors;Photonics North 2004: Photonic Applications in Astronomy, Biomedicine, Imaging, Materials Processing, and Education;2004-12-09
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