Calculation of postionization probabilities as a function of plasma parameters in electron gas secondary neutral mass spectrometry-Reference-Cited by-同舟云学术

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Calculation of postionization probabilities as a function of plasma parameters in electron gas secondary neutral mass spectrometry

Published:1988-07 Issue:4 Volume:6 Page:2287-2292
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Wucher A.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.575025

Cited by 26 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Surface and Thin-Film Analysis, 3. Ion Detection;Ullmann's Encyclopedia of Industrial Chemistry;2011-10-15

3. Electron-Impact (EI) Secondary Neutral Mass Spectrometry (SNMS);Surface and Thin Film Analysis;2011-04-12

4. Surface and Thin-Film Analysis;Ullmann's Encyclopedia of Industrial Chemistry;2002-01-15

5. Iron contamination in silicon technology;Applied Physics A: Materials Science & Processing;2000-05-01

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