Slow positron annihilation spectroscopy and electron microscopy of electron beam evaporated cobalt and nickel silicides-Reference-Cited by-同舟云学术

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Slow positron annihilation spectroscopy and electron microscopy of electron beam evaporated cobalt and nickel silicides

Published:1990-07 Issue:4 Volume:8 Page:3210-3217
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Frost R. L.,DeWald A. B.,Zaluzec M.,Rigsbee J. M.,Nielsen B.,Lynn K. G.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.576565

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Magnetron Sputtered SnOxFilms on Tin Probed by Slow Positron Implantation Spectroscopy;Acta Physica Polonica A;1999-04

2. INVESTIGATION OF THE EFFECT OF OXYGEN AND SUBSTRATE BIAS ON THE DEFECT STRUCTURE OF SPUTTER-DEPOSITED SnOX FILMS;Scripta Materialia;1997-12

3. Defects in sputter-deposited aluminium films, studied by X-ray diffraction and positron annihilation;Scripta Metallurgica et Materialia;1995-08

4. Structure and defect characterization of epitaxial CoSi2 on Si(001) formed using an amorphous Co75W25 sputtered layer;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1993-09

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