Affiliation:
1. Department of Bioengineering, NESAC/BIO, University of Washington , Seattle, Washington 98195
Abstract
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used widely throughout industrial and academic research due to the high information content of the chemically specific data it produces. Modern ToF-SIMS instruments can generate high mass resolution data that can be displayed as spectra and images (2D and 3D). This enables determining the distribution of molecules across and into a surface and provides access to information not obtainable from other methods. With this detailed chemical information comes a steep learning curve in how to properly acquire and interpret the data. This Tutorial is aimed at helping ToF-SIMS users to plan for and collect ToF-SIMS data. The second Tutorial in this series will cover how to process, display, and interpret ToF-SIMS data.
Funder
National Institute of Biomedical Imaging and Bioengineering
Subject
General Physics and Astronomy,General Biochemistry, Genetics and Molecular Biology,General Materials Science,Biomaterials,General Chemistry
Cited by
2 articles.
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