Trap studies in silicon nanowire junctionless transistors using low-frequency noise-Reference-Cited by-同舟云学术

Trap studies in silicon nanowire junctionless transistors using low-frequency noise

Published:2016-01 Issue:1 Volume:34 Page:011804
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
language:en
Short-container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Author:

Opondo Noah¹,Ramadurgam Sarath²,Yang Chen³,Mohammadi Saeed⁴

Affiliation:

1. Department of Physics and Astronomy, Purdue University, West Lafayette, Indiana 47907 and Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907

2. Department of Physics and Astronomy, Purdue University, West Lafayette, Indiana 47907

3. Department of Physics and Astronomy, Purdue University, West Lafayette, Indiana 47907 and Department of Chemistry, Purdue University, West Lafayette, Indiana 47907

4. Department of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907 and Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907

Funder

National Science Foundation (NSF)

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4939787

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1. Low-Frequency Noise Assessment of Vertically Stacked Si n-Channel Nanosheet FETs With Different Metal Gates;IEEE Transactions on Electron Devices;2020-11

2. Low–Frequency Noise in Vertically Stacked Si n–Channel Nanosheet FETs;IEEE Electron Device Letters;2020-03

3. Hysteresis free negative total gate capacitance in junctionless transistors;Semiconductor Science and Technology;2017-08-24

4. Top-down technique for scaling to nano in silicon MEMS;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2017-03