High-resolution depth profiling of In[sub x]Ga[sub 1−x]As/GaAs multiple quantum well structures by combination of secondary ion mass spectrometry and x-ray diffraction techniques
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Published:1997-11
Issue:6
Volume:15
Page:2037
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ISSN:0734-211X
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Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
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language:
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Short-container-title:J. Vac. Sci. Technol. B
Publisher
American Vacuum Society
Subject
General Engineering
Cited by
8 articles.
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