Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
25 articles.
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1. References;Secondary Ion Mass Spectrometry;2014-08-22
2. Secondary Ion Mass Spectrometry;2014-08-18
3. Storing Matter: a new analytical technique developed to improve the sensitivity and the quantification during SIMS analyses;Surface and Interface Analysis;2010-04-22
4. Application of the Storing Matter technique to the analysis of semiconductor materials;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2010-01
5. Cesium/xenon co-sputtering at different energies during ToF-SIMS depth profiling;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-12