Transferable GeSn ribbon photodetectors for high-speed short-wave infrared photonic applications

Author:

Zhao Haochen1ORCID,Park Suho1,Lin Guangyang1,Zhang Yuying2ORCID,Zhama Tuofu1,Samanta Chandan1ORCID,Chang Lorry1ORCID,Zhu Xiaofeng1ORCID,Feng Xu3,Díaz-Aponte Kevin O.4ORCID,Cong Lin4ORCID,Zeng Yuping1ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, University of Delaware 1 , Newark, Delaware 19716

2. Department of Materials Science and Engineering, University of Delaware 2 , Newark, Delaware 19716

3. Surface Analysis Facility, University of Delaware 3 , Newark, Delaware 19716

4. Department of Physics and Engineering, Delaware State University 4 , Dover, Delaware 19901

Abstract

We experimentally demonstrate a low-cost transfer process of GeSn ribbons to insulating substrates for short-wave infrared (SWIR) sensing/imaging applications. By releasing the original compressive GeSn layer to nearly fully relaxed state GeSn ribbons, the room-temperature spectral response of the photodetector is further extended to 3.2 μm, which can cover the entire SWIR range. Compared with the as-grown GeSn reference photodetectors, the fabricated GeSn ribbon photodetectors have a fivefold improvement in the light-to-dark current ratio, which can improve the detectivity for high-performance photodetection. The transient performance of a GeSn ribbon photodetector is investigated with a rise time of about 40 μs, which exceeds the response time of most GeSn (Ge)-related devices. In addition, this transfer process can be applied on various substrates, making it a versatile technology that can be used for various applications ranging from optoelectronics to large-area electronics. These results provide insightful guidance for the development of low-cost and high-speed SWIR photodetectors based on Sn-containing group IV low-dimensional structures.

Funder

U.S. Department of Energy

National Science Foundation

Publisher

American Vacuum Society

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