Direct measurement of density-of-states effective mass and scattering parameter in transparent conducting oxides using second-order transport phenomena-Reference-Cited by-同舟云学术

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Direct measurement of density-of-states effective mass and scattering parameter in transparent conducting oxides using second-order transport phenomena

Published:2000-11 Issue:6 Volume:18 Page:2978-2985
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Young D. L.,Coutts T. J.,Kaydanov V. I.,Gilmore A. S.,Mulligan W. P.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.1290372

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