Transport phenomena related to electron field emission from semiconductors through thick oxide layers-Reference-Cited by-同舟云学术

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Transport phenomena related to electron field emission from semiconductors through thick oxide layers

Published:1999 Issue:2 Volume:17 Page:520
ISSN:0734-211X
Container-title:Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
language:en
Short-container-title:J. Vac. Sci. Technol. B

Author:

Filip V.,Nicolaescu D.,Okuyama F.,Plavitu C. N.,Itoh J.

Publisher

American Vacuum Society

Subject

General Engineering

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. An analytical solution for microtip field emission current and effective emission area;Journal of Applied Physics;2002-06

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5. Photon assisted field emission from a silicon emitter;Solid-State Electronics;2001-06

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