Author:
Hirano Haruo,Yoshimura Nagamitsu
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Methods for measuring outgassing rates;Foundations of Molecular-Flow Networks for Vacuum System Analysis;2020
2. Applications of the resistor-network simulation method to complicated ultrahigh vacuum systems;Foundations of Molecular-Flow Networks for Vacuum System Analysis;2020
3. Molecular-flow networks;A Review: Ultrahigh-Vacuum Technology for Electron Microscopes;2020
4. Methods for measuring outgassing rates;A Review: Ultrahigh-Vacuum Technology for Electron Microscopes;2020
5. Development of JEOL SIPs;Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes;2013-07-31