Deposit and etchback approach for ultrathin Al2O3 films with low pinhole density using atomic layer deposition and atomic layer etching
Author:
Affiliation:
1. Department of Chemistry, University of Colorado, Boulder, Colorado 80309
2. Department of Mechanical Engineering, University of Colorado, Boulder, Colorado 80309
Funder
Sierra Nevada Corporation
Publisher
American Vacuum Society
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Link
https://avs.scitation.org/doi/pdf/10.1116/6.0001340
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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