X-ray photoelectron spectroscopic characterization of molybdenum nitride thin films-Reference-Cited by-同舟云学术

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X-ray photoelectron spectroscopic characterization of molybdenum nitride thin films

Published:2011-03-19 Issue:4 Volume:28 Page:1133-1138
ISSN:0256-1115
Container-title:Korean Journal of Chemical Engineering
language:en
Short-container-title:Korean J. Chem. Eng.

Author:

Choi Jeong-Gil

Publisher

Springer Science and Business Media LLC

Subject

General Chemical Engineering,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s11814-011-0036-2.pdf

Reference18 articles.

1. J-G. Choi, J. Kor. Cry. Tech., 20, 74 (2010).

2. J-G. Choi, J. Kor. Cry. Tech., 20, 80 (2010).

3. D. J. Sajkowski and S. T. Oyama, Prep. Petrol. Chem. Div., 199th ACS Nat. Meeting (1990).

4. S. T. Oyama, J. C. Schlatter, J. E. Metcalfe and J. M. Lambert, Ind. Eng. Chem. Res., 27, 1639 (1988).

5. J.-G. Choi, J. Ind. Eng. Chem., 8, 1 (2002).

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