An Inter-Test Cube Bit Stream Connectivity-Optimized X-Filling Approach Aiming Shift Power Reduction
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Publisher
Springer Singapore
Link
http://link.springer.com/content/pdf/10.1007/978-981-10-5520-1_44
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5. Wu F., Dilillo L., A. Bosio, Girard P., Pravossoudovitch S., Virazel A., J. Ma, W. Zhao, Tehranipoor M. and Wen X (2010) Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Fault Testing Schemes In Proc. of 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, pp. 376–381 doi: 10.1109/DDECS.2010.5491748
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