The Role of a Thin Aluminum Film in the Reconstruction of Silicon’s Near-Surface Layers

Author:

Lys R.,Pavlyk B.,Slobodzyan D.,Cebulski J.,Kushlyk M.

Publisher

Springer Singapore

Reference14 articles.

1. Drozdov NA, Patrin AA, Tkachev VD (1976) Recombination radiation at dislocations in silicon. JETP Lett 23(11):651–653

2. Sauer R, Kisielowski-Kemmerich C, Alexander H (1986) Dissociation-width-dependent radiative recombination of electrons and holes at widely split dislocations in silicon. Phys Rev Lett 57:1472–1475

3. Sobolev NA (2010) Defect engineering in implantation technology of silicon light-emitting structures with dislocation-related luminescence. Semi-Conductors 44(1):1–23

4. Pavlyk BV, Kushkyk MO, Slobodzyan DP (2015) About the nature of electroluminescence centers in plastically deformed crystals of p-type silicon. J Nano Electron Phys 7(3):03043

5. Pavlyk BV, Kushkyk MO, Slobodzyan DP (2017) Origin of dislocation luminescence centers and their reorganization in p-type silicon crystal subjected to plastic deformation and high temperature annealing. Nanoscale Res Lett 12(358):1–8

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