Recent Advances in PMOS Negative Bias Temperature Instability
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Publisher
Springer Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-16-6120-4.pdf
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper);2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14
2. Impact of Gate Insulator Process on NBTI in FinFETs and Resulting Ring Oscillator Degradation Under Normal and Overclocking Usage Conditions;2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2024-03-03
3. Quantifying NBTI Recovery and Its Impact on Lifetime Estimations in Advanced Semiconductor Technologies;2023 9th International Conference on Signal Processing and Communication (ICSC);2023-12-21
4. A Device to Circuit Framework for NBTI;2023 IEEE International Integrated Reliability Workshop (IIRW);2023-10-08
5. Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
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