Computer interpretation of phenomenological models of deep-level spectroscopy-Reference-Cited by-同舟云学术

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Computer interpretation of phenomenological models of deep-level spectroscopy

Published:1995-03 Issue:3 Volume:38 Page:272-276
ISSN:0543-1972
Container-title:Measurement Techniques
language:en
Short-container-title:Meas Tech

Author:

Krylov V. P.,Ustyuzhaninov V. N.

Publisher

Springer Science and Business Media LLC

Subject

Applied Mathematics,Instrumentation

Link

http://link.springer.com/content/pdf/10.1007/BF00977606.pdf

Reference15 articles.

1. D. Devries and A. A. Khan, J. Electron. Mater.,18, 763 (1989).

2. Zheng Xiangqin, Proc. Intern. Conf. on Semiconductor and Integrated Circuit Technology, Beijing, 1986, publ. Singapore (1986), p. 758.

3. T. Dabek, W. Darowski, and K. Korbel, Elektronika,30(6), 23 (1989).

4. L. S. Berman and A. A. Lebedev, Capacitative Spectroscopy of Deep Centers in Semiconductors [in Russian], Nauka, Leningrad (1981).

5. S. Li. Sheng, T. T. Chiu, and R. Y. Loo, IEEE Trans. Nucl. Sci.,NS-28, 4113 (1981).

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