LEIRIOS Test Generator: Automated Test Generation from B Models-Reference-Cited by-同舟云学术

LEIRIOS Test Generator: Automated Test Generation from B Models

Published:2006 Issue: Volume: Page:277-280
ISSN:0302-9743
Container-title:B 2007: Formal Specification and Development in B
language:
Short-container-title:

Author:

Jaffuel Eddie,Legeard Bruno

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/11955757_29.pdf

Reference7 articles.

1. Lecture Notes in Computer Science;B. Legeard,2002

2. Ambert, F., Bouquet, F., Chemin, S., Guenaud, S., Legeard, B., Peureux, F., Vacelet, N., Utting, M.: BZ-TT: A tool-set for test generation from Z and B using constraint logic programming. In: Proc. of Formal Approaches to Testing of Software, FATES 2002 (workshop of CONCUR 2002), Brnö, République Tchèque, August 2002, pp. 105–120 (2002)

3. Bernard, E., Legeard, B., Luck, X., Peureux, F.: Generation of test sequences from formal specifications: GSM 11-11 standard case study. International Journal of Software Practice and Experience 34(10), 915–948 (2004)

4. Legeard, B., Peureux, F., Utting, M.: Controlling test case explosion in test generation from B formal models. Software Testing, Verification and Reliability, STVR 14(2), 81–103 (2004)

5. Lecture Notes in Computer Science;F. Bouquet,2003

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