Surface potential studies using Kelvin force spectroscopy-Reference-Cited by-同舟云学术

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Surface potential studies using Kelvin force spectroscopy

Published:1998-03-01 Issue:7 Volume:66 Page:S273-S275
ISSN:0947-8396
Container-title:Applied Physics A: Materials Science & Processing
language:
Short-container-title:Applied Physics A: Materials Science & Processing

Author:

Lü J.,Guggisberg M.,Lüthi R.,Kubon M.,Scandella L.,Gerber C.,Meyer E.,Güntherodt H.-J.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science,General Chemistry

Link

http://link.springer.com/content/pdf/10.1007/s003390051144.pdf

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measurements of Electrostatic Potential Across p–n Junctions on Oxidized Si Surfaces by Scanning Multimode Tunneling Spectroscopy;Japanese Journal of Applied Physics;2011-04-20

2. Measurements of Electrostatic Potential Across p–n Junctions on Oxidized Si Surfaces by Scanning Multimode Tunneling Spectroscopy;Japanese Journal of Applied Physics;2011-04-01

3. Tuning the surface potential of Ag surfaces by chemisorption of oppositely-oriented thiolated carborane dipoles;Journal of Colloid and Interface Science;2011-02

4. Scanning Force Microscopies for Imaging and Characterization of Nanostructured Materials;Nanotechnology for Electronic Materials and Devices;2007

5. Contrast in scanning probe microscopy images of ultrathin insulator films;Applied Physics Letters;2006-02-06

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